宏茂微于2004年导入测试代工服务,平台由Adventest平台为主轴,提供存储器测试服务,满足客户端最终测试需求。
Tester | Capability Index | Configuration | Picture |
Advantest T5832 |
Test Data Rate | 1.2 Gbps |
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Digital Channels | 11264 | ||
DPS | 1152 | ||
PEM | 32 | ||
PSM144 | 8 | ||
Max DUT | 512 |
Tester | Capability Index | Configuration | Picture |
Teradyne
Magnum-V(U) |
Test Data Rate | 1.2 Gbps |
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Digital Channels | 8192 | ||
DPS/HV Channels | 2048/2048 | ||
HSB3 | 16(2 chassis*8 HSB3) | ||
UPB 2.1 | 128(VU only) | ||
TIU | 8192CH | ||
UI Ver | H6.23.2.1 | ||
Max DUT | 512 |
Tester | Capability Index | Configuration | Picture |
Advantest T5585 |
Test Data Rate | 500 MHz |
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Digital Channels | 2688 | ||
DPS | 192 | ||
PEM | 36 | ||
DC unit | 64 | ||
Max DUT | 128 |
Tester | Capability Index | Configuration | Picture |
Advantest T5593 |
Test Data Rate | 1.066GHz | ![]() |
Digital Channels | 3072 | ||
DPS | 320 | ||
PEM | 64 | ||
DC unit | 64 | ||
Max DUT | 128 |
Tester | Capability Index | Configuration | Picture |
Advantest T5581 |
Test Data Rate | 250 MHz |
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Digital Channels | 1600 | ||
DPS | 64 | ||
PEM | 96 | ||
DC unit | 32 | ||
Max DUT | 64 |
Process |
Capability Index |
Configuration |
Picture |
Burn In |
Slot |
48(24 x 2 chambers) |
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Test period |
100ns to 1.2ms |
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Temp. range |
-10~150 deg.C |
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DPS |
4V40AX2,15V3AX2 |
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Signal resource |
DR 100 ch, I/O 72 ch |
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Option |
Extend DPS (VS P4V20AX2) |
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DPM |
16G |
Tester | Capability Index | Configuration | Picture |
Diamond X Tester | Test Data Rate | 100MHz | ![]() |
I/O channels | 96 channels / board | ||
DPIN96 | 12 | ||
Max DUT | 256 |